casa / productos / Sensores, Transductores / Medidores de deformación / MMF003074
Número de pieza del fabricante | MMF003074 |
---|---|
Número de parte futuro | FT-MMF003074 |
SPQ / MOQ | Contáctenos |
Material de empaque | Reel/Tray/Tube/Others |
serie | CEA |
MMF003074 Estado (ciclo de vida) | En stock |
Estado de la pieza | Active |
tipo de patrón | Rectangular Rosette |
Rango de deformación | ±3% |
Resistencia | 350 Ohms |
Tolerancia de resistencia | ±0.4% |
Longitud - Activa | 0.062" (1.57mm) per section |
Longitud - Patrón general | 0.222" (5.64mm) |
Longitud total | 0.32" (8.1mm) |
Ancho - Activo | 0.062" (1.57mm) per section |
Ancho - Patrón general | 0.420" (10.67mm) |
Ancho - general | 0.48" (12.2mm) |
Temperatura de funcionamiento | -100 ~ 350°F (-75 ~ 175°C) |
País de origen | USA/JAPAN/MALAYSIA/MEXICO/CN |
MMF003074 Peso | Contáctenos |
Número de pieza de repuesto | MMF003074-FT |
FS-L-095-103-ST
Spectra Symbol
MMF017059
Micro-Measurements (Division of Vishay Precision G
MMF404066
Micro-Measurements (Division of Vishay Precision G
MMF403472
Micro-Measurements (Division of Vishay Precision G
MMF403206
Micro-Measurements (Division of Vishay Precision G
MMF403112
Micro-Measurements (Division of Vishay Precision G
MMF402184
Micro-Measurements (Division of Vishay Precision G
MMF402103
Micro-Measurements (Division of Vishay Precision G
MMF402062
Micro-Measurements (Division of Vishay Precision G
MMF323482
Micro-Measurements (Division of Vishay Precision G
LFEC3E-4TN144C
Lattice Semiconductor Corporation
XC2V250-5FGG256C
Xilinx Inc.
XC3S100E-5VQG100C
Xilinx Inc.
XA3S1400A-4FGG484Q
Xilinx Inc.
AGLN125V5-CSG81
Microsemi Corporation
A54SX72A-1PQ208M
Microsemi Corporation
EP3CLS70U484C7
Intel
5SGSED6K2F40I3L
Intel
XC5VLX50-2FFG1153I
Xilinx Inc.
5CGTFD9A5U19A7N
Intel